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A Simple Method to Extract the Thermal Resistance of GaN HEMTs from De-trapping Characteristics

Gonzalez, B. ; Nunes, L. C. ; Gomes, J. ; Mendes, J. C. ; Jimenez, J. L.

IEEE Electron Device Letters Vol. 44, Nº 6, pp. 891 - 894, June, 2023.

ISSN (print): 0741-3106
ISSN (online):

Scimago Journal Ranking: 1,32 (in 2022)

Digital Object Identifier: 10.1109/LED.2023.3265766