B. Gonzalez,
L. C. Nunes,
J. Gomes,
J. C. Mendes,
J. L. Jimenez,
A Simple Method to Extract the Thermal Resistance of GaN HEMTs from De-trapping Characteristics,
IEEE Electron Device Letters,
Vol. 44,
No. 6,
pp. 891 - 894,
June,
2023
| BibTex
J. Gomes,
L. C. Nunes,
N. Sobolev,
J. C. Pedro,
Memristive Properties of GaN HEMTs Containing Deep‐Level Traps,
Physica Status Solidi (B): Basic Research,
Vol. 256,
No. 5,
pp. 1800387 - 1800387,
December,
2018
| BibTex
J. Gomes,
L. C. Nunes,
J. C. Pedro,
Explaining the Different Time Constants Extracted from Low Frequency Y22 and IDS-DLTS on GaN HEMTs,
IEEE International Microwave Symposium IMS,
Los Angeles, CA, USA,
United States,
August,
2020,
| Abstract
| BibTex
J. Gomes,
L. C. Nunes,
J. C. Pedro,
Transient Pulsed S-Parameters for Trapping Characterization,
International Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits - INMMIC,
Cardiff,
United Kingdom,
July,
2020
| BibTex
J. Gomes,
L. C. Nunes,
C. Gonçalves,
J. C. Pedro,
Deep-Level Traps’ Capture Time Constant and its Impact on Nonlinear GaN HEMT Modeling,
International Workshop on Integrated Nonlinear Microwave and Millimeter-Wave Circuits - INMMIC,
Brive-la-Gaillarde,
France,
July,
2018
| BibTex
L. C. Nunes,
J. Gomes,
F. M. B. Barradas,
J. C. Pedro,
2022 EuMIC Prize,
Recognition as the best paper presented at the “17th European Microwave Integrated Circuits Conference (EuMIC)”, held in Milan, Italy, as part of the European Microwave Week 2022.,
01-09-2022
J. Gomes,
2020 MTT-S Graduate Student Fellowship Award,
The IEEE Microwave Theory and Techniques Society (MTT-S) Graduate Student Fellowship awards are sponsored by the MTT-S to encourage and support graduate students from around the world who are interested in pursuing the field of microwave engineering. The fellowship honorees receive an award of US$6,000.,
01-08-2020
J. Gomes,
L. C. Nunes,
J. C. Pedro,
Best Student Paper Award INMMiC 2020 (Second Place),
2nd place of the best student paper award for the paper "Transient Pulsed S-Parameters for Trapping Characterization" presented at the International Workshop on Integrated Nonlinear Microwave and Millimetre-wave Circuits - VIRTUAL EVENT 16-17/07/2020 - Cardiff, UK,
01-07-2020