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Optics and Photonics
Caracterização por elipsometria de filmes finos para aplicações em óptica integrada
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Optics and Photonics
CONCLUDED MSC THESIS
Caracterização por elipsometria de filmes finos para aplicações em óptica integrada
Vasco R. Fernandes
Supervisors:
Paulo Sergio de Brito Andre
, Maria Rute Ferreira André
University:
Universidade de Aveiro
Keywords:
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