Researcher Lian Xie, a PhD student at Instituto Superior Técnico, Universidade de Lisboa, under the supervision of Helena Ramos, our researcher, has received the Best Presentation Award at the International Conference on Sensors and their Applications (ICSA 2026), held in Chengdu, China.

The award recognized her work entitled “Subsurface Defect Detection Based on Background Cancellation Eddy Current Probe”, which presents an innovative approach to improving the detection of hidden defects in metallic structures.

Lian Xie’s doctoral research focuses on eddy current testing (ECT) for subsurface defect detection, with the aim of increasing the sensitivity, reliability, and accuracy of non-destructive evaluation. Her work combines advanced electromagnetic sensing with signal processing and data-driven analysis to improve the identification and characterization of defects beneath conductive surfaces.

The awarded research proposes a background-cancellation eddy current probe designed to suppress unwanted background signals and enhance defect-related responses. This approach can contribute to more accurate defect detection and depth characterization, addressing key challenges in the inspection of metallic structures and supporting more reliable structural health monitoring and industrial applications.

The Best Presentation Award recognizes both the scientific relevance of the research and the quality of its presentation at an international forum bringing together researchers and practitioners in sensor technologies, measurement systems, and their applications.

Photo credits: Sónia Pina/IT