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The Histogram Test of ADCs with Sinusoidal Stimulus is Unbiased by Phase Noise

Alegria, F. ; Serra, A.

IEEE Transactions on Instrumentation and Measurement Vol. 58, Nº 11, pp. 3847 - 3854, November, 2009.

ISSN (print): 0018-9456
ISSN (online):

Journal Impact Factor: 1,790 (in 2014)

Digital Object Identifier: 10.1109/TIM.2009.2020842

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Abstract
This paper intends to show that the presence of normally distributed phase noise or jitter in the test setup or in the analog-to-digital converter (ADC) itself does not cause a bias in the sinusoidal histogram test estimation of the transfer function of an ADC. The analytical proof presented demonstrates that there is no need to use an extra overdrive when stimulating the ADC, as is the case with amplitude noise.