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Creating and sharing knowledge in communications and information technology

Graph-based contrastive learning for self-supervised semiconductor wafer defect detection

Awais, M. ; Postolache, O. ; Oliveira, S.

journal of intelligent manufacturing Vol. , Nº , pp. - , July, 2026.

ISSN (print): 0956-5515
ISSN (online): 1572-8145

Scimago Journal Ranking: 1,89 (in 2025)

Digital Object Identifier: 10.1007/s10845-026-02906-3

Abstract