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Bispectral Analysis for Subsurface Defect Detection Using a Differential-Excitation PECT Probe

Xie, L. X. ; Baskaran, P. ; Feng, B. ; Alegria, F. ; Ribeiro, A. L. ; Ramos, H.

IEEE Transactions on Instrumentation and Measurement Vol. 74, Nº , pp. 1 - 9, November, 2025.

ISSN (print): 0018-9456
ISSN (online): 1557-9662

Scimago Journal Ranking: 1,53 (in 2025)

Digital Object Identifier: 10.1109/TIM.2025.3632440

Abstract