Journal Paper

An Eddy Current Probe with Minimum Background Magnetic Field for the Detection of Deeply Buried Defects

Xie, L. X. ; Baskaran, P. ; Feng, B. ; Pasadas, D. ; Ribeiro, A. L. ; Ramos, H.

IEEE Sensors Journal Vol. 25, Nº 12, pp. 21716 - 21724, June, 2025.

ISSN (print): 1530-437X
ISSN (online): 1558-1748

Scimago Journal Ranking: 0,95 (in 2025)

Digital Object Identifier: 10.1109/JSEN.2025.3558650