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Impedance Measurements Using Genetic Algorithms and Multiharmonic Signals

Janeiro, F. M. ; Ramos, P. M.

IEEE Transactions on Instrumentation and Measurement Vol. 58, Nº 2, pp. 383 - 388, February, 2009.

ISSN (print): 0018-9456
ISSN (online): 1557-9662

Scimago Journal Ranking: 0,42 (in 2009)

Digital Object Identifier: 10.1109/TIM.2008.2005077

In this paper, a procedure to measure impedances
using data-acquisition boards and genetic algorithms is developed. This approach to impedance measurements has the advantage of being low cost. The multiharmonic acquired waveforms are characterized using a genetic algorithm that finds the frequency of the signal, which, in turn, is used in a multiple linear least-squares (LS) waveform-fitting algorithm. The magnitude and phase of
the unknown impedance can then be evaluated. A multiharmonic signal is used so that the frequency dependence of the impedance can be obtained from a single measurement. The measurement results are validated by measurements made with an impedance
analyzer. The main advantage of the genetic algorithm over traditional search methods is its robustness to convergence problems.