A Technique to Reduce On-Wafer Measurement Uncertainty for CMOS Transmission Line Characterization

Assunção, M. ; Santos, P. M. ; Costa Freire, J.

IEEE Microwave and Wireless Components Letters Vol. PP, Nº 99, pp. 1 - 3, November, 2015.

ISSN (print): 1531-1309
ISSN (online): 1558-1764

Scimago Journal Ranking: 0,72 (in 2015)

Digital Object Identifier: 10.1109/LMWC.2015.2495131