Abstract- This paper presents two new methods for measuring the static characteristic of high resolution Digital to Analog Converters (DACs). Both proposed methods are based on the conversion of the DAC output voltage to time by using a fast comparator and a reference calibrator. The main advantage of this approach is that time can be measured in the electronic domain much more accuratelythan amplitude. Both methods are based on direct time measurement by a high frequency counter and on the registration of the input DAC code. From the obtained information a Personal Computer (PC) evaluates the Integral Non Linearity (INL) and the Differential Non Linearity (DNL). Another advantage of the proposed methods is the relatively low requirements on all laboratory equipment involved.