This demonstrator presents a novel framework for the characterization and modeling of mixed-signal systems. It will be shown that a joint analog and digital analysis is relevant for future radio-frequency (RF) components and devices. A characterization procedure suitable for mixed-signal systems is presented based on a National Instruments (NI) PXI architecture by analyzing the system in a scattering wave perspective at each port. This framework allows an RF engineer to integrate innovative mixed-signal models on available RF/microwave simulators, such as the NI AWR Microwave Office. An example of various analog-to-digital-converters (ADCs) will be carried out by measuring its linear parameters, and then using it inside a simulator tool.