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Gaussian Jitter Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting

Alegria, F. ; Serra, A.

IEEE Transactions on Instrumentation and Measurement Vol. 59, Nº 9, pp. 2328 - 2333, September, 2010.

ISSN (print): 0018-9456
ISSN (online):

Journal Impact Factor: 1,790 (in 2014)

Digital Object Identifier: 10.1109/TIM.2009.2034576

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In this paper, the bias on the estimated amplitude, which is caused by Gaussian jitter, is studied in case of the IEEE 1057 standard three-parameter sine-fitting method. Because no analytical study exists, this source of uncertainty is usually not
considered. Nowadays, it is becoming more and more important
due to the ever increasing sampling rates available in analog-to-digital converters (ADCs), which are used in innumerable application like high-speed digital oscilloscopes. The effect of additive noise is also taken into account.