Precision of Independently Based Gain and Offset Error of an ADC using the Histogram Method
IEEE Transactions on Instrumentation and Measurement Vol. 58, Nº 3, pp. 512 - 521, March, 2009.
ISSN (print): 0018-9456
ISSN (online): 1557-9662
Scimago Journal Ranking: 0,42 (in 2009)
Digital Object Identifier: 10.1109/TIM.2008.2005261
Download Full text PDF ( 377 KBs)
Downloaded 1 time
Abstract—Two of the parameters that are determined when testing an analog-to-digital converter (ADC) are the gain and offset errors. One of the ways to define these two parameters is called “independently based.” In this paper, we derive the precision of the gain and offset errors estimated with the histogram test method affected by additive noise.