Subramaniyan, S. ; Ferraz, Ó. ; Ashuthosh, M. ; Krishna, S. ; Wang, G. W. ; Cavallaro, J. R. C. ; Silva, V. ; Falcão, G. ; Purnaprajna, M. P.
IEEE Design and Test Vol. 40, Nº 1, pp. 85 - 95, August, 2022.
ISSN (print): 2168-2356
ISSN (online):
Scimago Journal Ranking: 0,60 (in 2021)
Digital Object Identifier: 10.1109/MDAT.2022.3202852
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