Jacob Scharcanski is an Associate Professor in Computer Science at the Federal University of Rio Grande do Sul (UFRGS), Brasil. He holds a cross appointment with the Department of Electrical Engineering at UFRGS, and also is an Associate Adjunct Professor with the Department of Systems Design Engineering, University of Waterloo, Ontario, Canada. He has authored and co-authored over 130 refereed journal and conference papers, and has contributed to several books on imaging and measurements. In addition to his academic publications, he has several technology transfers to the private sector. Presently, he serves as an Associate Editor for two journals, and has served on dozens of International Conference Committees. Professor Scharcanski is a licensed Professional Engineer, Senior Member of the IEEE, and serves as Chair of the Technical Committee IEEE IMS TC-17 (Materials in Measurements) and as Co-Chair of the Technical Committee IEEE IMS TC-19 (Imaging Measurements and Systems). His areas of expertise are
Instrumentation, Imaging Measurements and their Applications.