@ARTICLE {855,
author={C. Fager and J. C. Pedro and N.B.C. Carvalho and H. Zirath and F. Fortes and M.  Rosário},
doi={10.1109/JSSC.2003.820860},
journal={IEEE Journal of Solid-State Circuits},
title={A Comprehensive Analysis of IMD Behavior in RF CMOS Power Amplifiers},
year={2004},
month={January},
volume={39},
number={1},
pages={24-34},
ISSN={0018-9200}
}
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