@ARTICLE {29657,
author={D. Pasadas and P. Baskaran and H.  Ramos and A. L. Ribeiro},
doi={10.1109/JSEN.2019.2951302},
journal={IEEE Sensors Journal},
title={Detection and Classification of Defects Using ECT and Multi-level SVM model},
year={2020},
month={March},
volume={20},
number={5},
pages={2329-2338},
ISSN={1530-437X}
}