@ARTICLE {17714,
author={A. Kiazadeh and H.L. Gomes},
doi={10.1063/1.4919057},
journal={Applied Physics Letters},
title={Operational stability of solution based zinc tin oxide/SiO2 thin film transistors under gate bias stress},
year={2015},
month={April},
volume={3},
number={6},
pages={062804-062804},
ISSN={1077-3118}
}
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