@ARTICLE {17628,
author={M. Assunção and P. M. Santos and J. Costa Freire},
doi={10.1109/LMWC.2015.2495131},
journal={IEEE Microwave and Wireless Components Letters},
title={A Technique to Reduce On-Wafer Measurement Uncertainty for CMOS Transmission Line Characterization},
year={2015},
month={November},
volume={PP},
number={99},
pages={1-3},
ISSN={1531-1309}
}