@INPROCEEDINGS {9959,
author={- Li and J. Kral and R. Šmid and H.  Ramos and A. L. Ribeiro},
doi={},
booktitle={IEEE Instrumentation and Measurement Technology Conf.},
title={Thickness Measurement Using Transient Eddy Current Techniques},
year={2011},
month={May},
volume={00},
pages={138-143} 
}