@INPROCEEDINGS {7303, author={H. Ramos and O. Postolache and F. Alegria and A. L. Ribeiro}, doi={}, booktitle={IEEE Instrumentation and Measurement Technology Conf.}, title={Using the Skin Effect to Estimate Cracks Depths in Mettalic Structures}, year={2009}, month={May}, volume={CD}, pages={1361-1366} }Create and download bib file