@INPROCEEDINGS {7303,
author={H.  Ramos and O. Postolache and F. Alegria and A. L. Ribeiro},
doi={},
booktitle={IEEE Instrumentation and Measurement Technology Conf.},
title={Using the Skin Effect to Estimate Cracks Depths in Mettalic Structures},
year={2009},
month={May},
volume={CD},
pages={1361-1366} 
}
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