@INPROCEEDINGS {6138,
author={P. M. Ramos and F. M. Janeiro and M. Tlemçani  and A. Serra},
doi={},
booktitle={IEEE International Instrumentation and Technology Conf. - I2MTC},
title={Uncertainty analysis of impedance measurements using DSP implemented ellipse fitting algorithms},
year={2008},
month={May},
volume={1},
pages={463-467} 
}
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