@INPROCEEDINGS {34294,
author={L.  Bento and L.M. Távora and P.A. Assunção and S.M.M. Faria and R. Pinto},
doi={10.23919/MIPRO.2018.8400033},
booktitle={IEEE International Convention on Information and Communication Technology, Electronics and Microelectronics MIPRO},
title={Using local binary patterns in speckle image analysis},
year={2018},
month={May},
volume={},
pages={314-317} 
}