@INPROCEEDINGS {27990,
author={C. S Angani and H.  Ramos and T. Rocha and A. L. Ribeiro},
doi={},
booktitle={IEEE International Instrumentation and Measurement Technology Conference  I2MTC},
title={SVM Classification of Thickness and Lift-off Using Transient Eddy Current Oscillation Method},
year={2016},
month={May},
volume={1},
pages={1-6} 
}