@INPROCEEDINGS {210,
author={P. M. Santos and S. Finco and M. I.  Simas and M. Lança},
doi={},
booktitle={IEEE Industry Application Society Annual Meeting},
title={Breakdown Voltage Improvement of Standard MOS Technologies Targeted at Smart Power},
year={1995},
month={October},
volume={2},
pages={937-945} 
}