@INPROCEEDINGS {1673,
author={P. M. Santos and HJQ Quaresma and A. Silva and M. Lança},
doi={},
booktitle={European Power Electronics Conf. - EPE},
title={Breakdown improvement and reliable driving of high-voltage NMOS fabricated in fully implanted CMOS},
year={2003},
month={September},
volume={CDROM},
pages={p1-p10} 
}